Extended Short-Wave Infrared (eSWIR) High-Resolution Wavefront Sensor
The SID4-eSWIR HR by Phasics is a high-resolution wavefront sensor for the extended short-wave infrared (eSWIR) band. Using an InGaAs detector and Phasics’ patented quadriwave...
Extended Short-Wave Infrared (eSWIR) High-Resolution Wavefront Sensor
High-resolution wavefront analysis for eSWIR (1.4–2.1 µm). Ideal for 2 µm laser testing, SWIR optics metrology and defence research.
The SID4-eSWIR HR by Phasics is a high-resolution wavefront sensor for the extended short-wave infrared (eSWIR) band. Using an InGaAs detector and Phasics’ patented quadriwave lateral shearing interferometry (QWLSI), it measures phase and intensity across 1.4–2.1 µm with 159 × 127 sampling and 60 µm spatial resolution, in a single shot and in real time.
Available in India through United Spectrum Instruments, Phasics’ channel sales partner, the SID4-eSWIR HR helps scientists, engineers and system integrators characterise eSWIR lasers, optics and beam paths for laser testing, adaptive optics and optical metrology.
Understanding the Extended Short-Wave Infrared (eSWIR) High-Resolution Wavefront Sensor
The SID4-eSWIR HR Wavefront Sensor is a high-resolution optical metrology system for the extended shortwave infrared (eSWIR) band, with a wavelength range of 1.4–2.1 µm. It combines Phasics’ patented quadriwave lateral shearing interferometry (QWLSI®) with an InGaAs detector to deliver quantitative phase and intensity measurements at 159 × 127 sampling points and 60 µm spatial resolution. Self-referenced and easy to set up, it characterises eSWIR lasers, optics and imaging systems in real time at 10 Hz. The SID4-eSWIR HR is suited to 2 µm laser diagnostics, SWIR lens testing, optical communications, and defence and surveillance optics.
Technical Specifications
| Parameter | Specification |
|---|---|
| Wavelength Range | 1.4 – 2.1 µm (1400 – 2100 nm) |
| Detector | InGaAs |
| Measurement Principle | Quadriwave Lateral Shearing Interferometry (QWLSI) |
| Phase & Intensity Sampling | 159 × 127 |
| Spatial Resolution | 60 µm |
| Aperture Dimension | 9.54 × 7.62 mm² |
| Phase Resolution | < 6 nm RMS (coherent sources) |
| Absolute Accuracy | < 40 nm RMS (coherent sources) |
| Real-time Processing | 10 Hz (full resolution) |
| Interface | Giga Ethernet |
| Dimensions (W × H × L) | 90 × 115 × 120 mm³ |
| Weight | ~1 kg |
Key Features and Advantages
QWLSI® Technology
Phasics’ patented quadriwave lateral shearing interferometry delivers quantitative phase and intensity measurements in a single shot.
Extended SWIR Spectral Range (1.4 – 2.1 µm)
An InGaAs detector covers the eSWIR band, ideal for 2 µm lasers and eSWIR optical systems.
High Spatial Resolution
159 × 127 phase and intensity sampling with 60 µm spatial resolution, twice the sampling of the standard SID4-eSWIR in each direction.
Precise Phase Measurement
Phase resolution below 6 nm RMS and absolute accuracy below 40 nm RMS for coherent sources.
Real-Time Processing
Full-resolution processing at 10 Hz supports live alignment and monitoring of eSWIR optical systems.
Compact, Self-Referenced Design
No reference arm is needed, which simplifies integration into optical benches, research labs and industrial systems.
Advanced Data Analysis
Generates wavefront, MTF and PSF maps for complete optical system evaluation.
Advantages:
- High-resolution wavefront sensing across the 1.4–2.1 µm eSWIR band
- Single-shot measurement for fast, repeatable results
- Real-time phase analysis supports system optimisation and process control
- Supports R&D in laser testing, optical metrology, defence and optical communications
- Self-referenced, plug-and-play design reduces setup time and complexity
- Repeatable measurements for industrial quality assurance
- Giga Ethernet interface for straightforward lab and production integration
- Large 9.54 × 7.62 mm² aperture
Applications Across Industries
Laser Testing & Beam Qualification
Measures the wavefront and beam quality of eSWIR lasers, including 2 µm sources, for R&D and production testing.
Adaptive Optics
Provides high-resolution wavefront feedback for closed-loop correction with deformable mirrors in the eSWIR band.
Laser System Alignment
Supports alignment and optimisation of eSWIR laser chains and beam delivery optics.
Gas & Plasma Metrology
Quantitative phase imaging for gas jet and plasma density measurements.
Lens & Optical System Testing
Characterises SWIR lenses and assemblies at their design wavelength, including aberrations and MTF.
Defence & Night Vision
Tests SWIR optics used in night-vision, military and surveillance devices.
Free-Space Optical Communications & Aerospace
Qualifies SWIR transmitters, receivers and optics for FSOC terminals and space systems, including wavefront monitoring during TVAC testing.
Automotive & Laser Industry
Supports quality control of SWIR optical components for automotive sensing and industrial laser manufacturing.
In India, the SID4-eSWIR HR is supplied and supported by United Spectrum Instruments for research institutions, defence laboratories and photonics manufacturers.
Why Choose United Spectrum Instruments?
United Spectrum Instruments (USI) is the channel sales partner for Phasics SID4-eSWIR HR wavefront sensors in India, offering expert sales and technical support.
- Genuine Phasics SID4-eSWIR HR systems with full manufacturer warranty
- Application expertise in laser testing, optical metrology, defence, aerospace and free-space optical communications
- Pan-India installation, integration, training and after-sales service
- Guidance on choosing between SID4-eSWIR HR, SID4-eSWIR and other SID4 models for your wavelength and resolution needs
- Competitive pricing supported by reliable technical expertise
Founded in 2012 and based in Chennai, USI is an independent photonics company serving Indian research institutions, defence laboratories and industrial manufacturers with advanced wavefront sensing and optical metrology solutions from Phasics.
FAQs
What is the key advantage of QWLSI over Shack-Hartmann sensors?
QWLSI enables full-field, single-shot measurements with higher spatial resolution and greater robustness to beam misalignments and optical aberrations. It captures both phase and intensity without scanning or moving parts.
Can the SID4-eSWIR HR measure pulsed eSWIR lasers?
Yes. The sensor supports single-shot acquisition and is compatible with both CW and pulsed infrared sources, including nanosecond and ultrafast laser systems.
Is this sensor compatible with adaptive optics systems?
Absolutely. The SID4-eSWIR HR is well suited to adaptive optics setups and supports real-time wavefront feedback for deformable mirror control in eSWIR applications.
Can the system be used in high-power laser environments?
Yes, with the appropriate beam attenuation optics, the sensor can safely analyse high-power eSWIR laser beams, ensuring stable and safe operation.
What kind of software is provided with the sensor?
Phasics includes a graphical interface for real-time analysis, along with a full SDK (Software Development Kit) that supports custom integration with LabVIEW, Python, and C++ environments.
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FAQs
What is the key advantage of QWLSI over Shack-Hartmann sensors?
QWLSI enables full-field, single-shot measurements with higher spatial resolution and greater robustness to beam misalignments and optical aberrations. It captures both phase and intensity without scanning or moving parts.
Can the SID4-eSWIR HR measure pulsed eSWIR lasers?
Yes. The sensor supports single-shot acquisition and is compatible with both CW and pulsed infrared sources, including nanosecond and ultrafast laser systems.
Is this sensor compatible with adaptive optics systems?
Absolutely. The SID4-eSWIR HR is well suited to adaptive optics setups and supports real-time wavefront feedback for deformable mirror control in eSWIR applications.
Can the system be used in high-power laser environments?
Yes, with the appropriate beam attenuation optics, the sensor can safely analyse high-power eSWIR laser beams, ensuring stable and safe operation.
What kind of software is provided with the sensor?
Phasics includes a graphical interface for real-time analysis, along with a full SDK (Software Development Kit) that supports custom integration with LabVIEW, Python, and C++ environments.
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