Extended Short-Wave Infrared (eSWIR) Wavefront Sensor
The SID4-eSWIR by Phasics brings quadriwave lateral shearing interferometry to the extended short-wave infrared (eSWIR) band. Using a T2SL detector, it delivers accurate phase and...
Extended Short-Wave Infrared (eSWIR) Wavefront Sensor
Redefining Wavefront Analysis in the Infrared Spectrum - Precision Wavefront Sensing for Extended SWIR (1.4–2.1 µm)
The SID4-eSWIR by Phasics brings quadriwave lateral shearing interferometry to the extended short-wave infrared (eSWIR) band. Using a T2SL detector, it delivers accurate phase and intensity measurements across 1.4–2.1 µm, a spectral range increasingly important for 2 µm lasers, remote sensing, optical communications and defence technologies.
Exclusively distributed in India by United Spectrum Instruments, the SID4-eSWIR is built for professionals and researchers who need dependable performance in beam diagnostics, optical system alignment and advanced IR metrology.
Understanding the Extended Short-Wave Infrared (eSWIR) Wavefront Sensor
The SID4-eSWIR Wavefront Sensor is an optical metrology solution for the extended shortwave infrared (eSWIR) band, with a wavelength range of 1.4–2.1 µm. It combines Phasics’ patented quadriwave lateral shearing interferometry (QWLSI®) with a T2SL detector to deliver quantitative phase and intensity measurements at 80 × 64 sampling points and 120 µm spatial resolution. Self-referenced and easy to set up, it characterises eSWIR lasers, optics and imaging systems in real time at 10 Hz. The SID4-eSWIR suits 2 µm laser diagnostics, SWIR lens testing, optical communications, and defence and surveillance optics. For finer spatial detail, the SID4-eSWIR HR offers 159 × 127 sampling at 60 µm resolution.
Technical Specifications
| Parameter | Value |
|---|---|
| Wavelength Range | 1.4 – 2.1 µm (1400 – 2100 nm) |
| Detector | T2SL (Type-II Superlattice) |
| Technology | Quadriwave Lateral Shearing Interferometry (QWLSI) |
| Phase & Intensity Sampling | 80 × 64 |
| Spatial Resolution | 120 µm |
| Aperture Dimension | 9.60 × 7.68 mm² |
| Phase Resolution | < 6 nm RMS (coherent sources) |
| Absolute Accuracy | < 40 nm RMS (coherent sources) |
| Real-time Processing | 10 Hz (full resolution) |
| Interface | Giga Ethernet |
| Dimensions (W × H × L) | 90 × 115 × 120 mm³ |
| Weight | ~1 kg |
Key Features and Advantages
QWLSI® Technology
Phasics’ patented quadriwave lateral shearing interferometry delivers quantitative phase and intensity measurements in a single shot.
Extended SWIR Spectral Range (1.4 – 2.1 µm)
A T2SL detector covers the eSWIR band, ideal for 2 µm lasers and eSWIR optical systems.
Precise Phase Measurement
Phase resolution below 6 nm RMS and absolute accuracy below 40 nm RMS for coherent sources.
Real-Time Processing
Full-resolution processing at 10 Hz supports live alignment and monitoring of eSWIR optical systems.
Compact, Self-Referenced Design
No reference arm is needed, which simplifies integration into optical benches, research labs and industrial systems.
Advanced Data Analysis
Generates wavefront, MTF and PSF maps for complete optical system evaluation.
Advantages:
- Precise wavefront sensing across the 1.4–2.1 µm eSWIR band
- Single-shot measurement, insensitive to vibration
- Real-time phase analysis supports system optimisation and process control
- Supports R&D in photonics, defence and optical communications
- Self-referenced, plug-and-play design reduces setup time and complexity
- Repeatable measurements for industrial quality assurance
- Giga Ethernet interface for straightforward lab and production integration
- Higher-resolution option available: SID4-eSWIR HR (159 × 127 sampling, 60 µm)
Applications Across Industries
Laser Testing & Beam Qualification
Measures the wavefront and beam quality of eSWIR lasers, including 2 µm sources, for R&D and production testing.
Adaptive Optics
Provides wavefront feedback for closed-loop correction with deformable mirrors in the eSWIR band.
Laser System Alignment
Supports alignment and optimisation of eSWIR laser chains and beam delivery optics.
Gas & Plasma Metrology
Quantitative phase imaging for gas jet and plasma density measurements.
Lens & Optical System Testing
Characterises SWIR lenses and assemblies at their design wavelength, including aberrations and MTF.
Defence & Night Vision
Tests SWIR optics used in night-vision, military and surveillance devices.
Free-Space Optical Communications & Aerospace
Qualifies SWIR transmitters, receivers and optics for FSOC terminals and space systems, including wavefront monitoring during TVAC testing.
Automotive & Laser Industry
Supports quality control of SWIR optical components for automotive sensing and industrial laser manufacturing.
In India, the SID4-eSWIR is supplied and supported by United Spectrum Instruments for research institutions, defence laboratories and photonics manufacturers.
Why Choose United Spectrum Instruments?
United Spectrum Instruments (USI) is the channel sales partner for Phasics SID4-eSWIR wavefront sensors in India, offering expert sales and technical support.
- Genuine Phasics SID4-eSWIR systems with full manufacturer warranty
- Application expertise in laser testing, optical metrology, defence, aerospace and free-space optical communications
- Pan-India installation, integration, training and after-sales service
- Guidance on choosing between SID4-eSWIR, SID4-eSWIR HR and other SID4 models for your wavelength and resolution needs
- Competitive pricing supported by reliable technical expertise
Founded in 2012 and based in Chennai, USI is an independent photonics company serving Indian research institutions, defence laboratories and industrial manufacturers with advanced wavefront sensing and optical metrology solutions from Phasics.
FAQs
What makes SID4-eSWIR suitable for extended SWIR applications?
It’s designed to cover the 1100–2450 nm range with ultra-high resolution, making it ideal for eye-safe lasers, IR coatings, telecom systems, and defence optics.
Can it measure both coherent and incoherent SWIR sources?
Yes. Unlike most traditional sensors, the SID4-eSWIR works with both laser and broadband IR sources, enabling broader applications.
How does it compare to standard wavefront sensors?
SID4-eSWIR offers 20x the spatial resolution of many Shack-Hartmann systems, with nanometric precision and real-time single-shot acquisition.
Is the sensor compact enough for OEM or field use?
Absolutely. Its camera-sized footprint (94 x 64 x 64 mm³) allows easy installation into benchtop and portable setups.
Does Phasics provide calibration and support?
Yes. Each sensor is factory-calibrated, and additional calibration utilities are included. United Spectrum Instruments offers local technical support in India.
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FAQs
What makes SID4-eSWIR suitable for extended SWIR applications?
It’s designed to cover the 1100–2450 nm range with ultra-high resolution, making it ideal for eye-safe lasers, IR coatings, telecom systems, and defence optics.
Can it measure both coherent and incoherent SWIR sources?
Yes. Unlike most traditional sensors, the SID4-eSWIR works with both laser and broadband IR sources, enabling broader applications.
How does it compare to standard wavefront sensors?
SID4-eSWIR offers 20x the spatial resolution of many Shack-Hartmann systems, with nanometric precision and real-time single-shot acquisition.
Is the sensor compact enough for OEM or field use?
Absolutely. Its camera-sized footprint (94 x 64 x 64 mm³) allows easy installation into benchtop and portable setups.
Does Phasics provide calibration and support?
Yes. Each sensor is factory-calibrated, and additional calibration utilities are included. United Spectrum Instruments offers local technical support in India.
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